- Introduced a new testbench for the SDIO wrapper () to validate APB interactions.
- Updated to include IRQ handling for SDIO0 and SDIO1.
- Enhanced to account for performance management of SDIO0 and SDIO1.
- Modified memory map tests to include SDIO base addresses and performance wait offsets.
- Updated pin mapping tests to include SDIO1 signals.
- Created a comprehensive suite of SDIO tests () covering various functionalities including CRC, command engine, DMA, and standalone operations.
- Added a new test for verifying SDIO register parity against the RTL definition.
- Adjusted SOC topology tests to reflect the addition of SDIO in the IRQ and APB fabric.
